The oxidized layer on ZrB2(0001)
T. Aizawa, Shunichi Hishita, Shigeki Otani
Abstract
T. Aizawa, Shunichi Hishita, Shigeki Otani
Abstract
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Key concepts: X-ray photoelectron spectroscopy, Auger electron spectroscopy, Reflection high-energy electron diffraction, Electron energy loss spectroscopy, Electron diffraction, High resolution electron energy loss spectroscopy, Layer (electronics), Low-energy electron diffraction