Refraction influence analysis and investigations on automated elimination of refraction effects on geodetic measurements
Burkhard Böckem, Philipp Flach, Alexandra Weiss, Maria Hennes
Abstract
Burkhard Böckem, Philipp Flach, Alexandra Weiss, Maria Hennes
Abstract
Refraction effects are generally caused by an inhomogeneous propaga- tion medium for the optical beam and are recognized as today's major source of systematic errors in the precise optical determination of angles and distances. Be- cause meteorological point measurements do not deliver satisfactory correction val- ues, the investigation of alternative methods motivated the development of a disper- someter, a metrological solution with a very sophisticated instrumental set-up. Fur- thermore, the compensation of deterministic refraction effects basing on atmospheric scintillation is envisaged: Optical scintillation measurements with a scintillometer or with CCD-sensors yield line averaged turbulence parameters of the atmospheric surface layer, which can be used for determining the refractive index gradient. Be- cause CCD-sensors are implemented in today's high-end surveying instruments, automated on-board-solutions will be possible.
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Refraction effects are generally caused by an inhomogeneous propaga- tion medium for the optical beam and are recognized as today's major source of systematic errors in the precise optical determination of angles and distances. Be- cause meteorological point measurements do not deliver satisfactory correction val- ues, the investigation of alternative methods motivated the development of a disper- someter, a metrological solution with a very sophisticated instrumental set-up. Fur- thermore, the compensation of deterministic refraction effects basing on atmospheric scintillation is envisaged: Optical scintillation measurements with a scintillometer or with CCD-sensors yield line averaged turbulence parameters of the atmospheric surface layer, which can be used for determining the refractive index gradient. Be- cause CCD-sensors are implemented in today's high-end surveying instruments, automated on-board-solutions will be possible.
Key concepts: Scintillometer, Scintillation, Atmospheric refraction, Refraction, Optics, Geodetic datum, Refractive index, Remote sensing