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1997•Bulletin of the Korean Chemical SocietyRequires access

ANALYTICAL CHARACTERISTICS AND APPLICATIONS OF LASER IONIZATION MASS SPECTROMETRY

Hoong-Sun Im, Hyeun-Joong Yoon, Seong Kyu Kim

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Abstract

We have built a laser ionization mass spectrometer (LIMS) for chemical composition analysis of solid samples, which employs an Nd:YAG laser and a time-of-flight mass analyzer. In this spectrometer, the maximum mass we identified clearly is higher than 2000 amu. A mass resolution of 230 has been achieved at m/z 208 (Pb element) in the linear TOFMS and can be even improved up to 1550 by employing a reflectron. The detection limit is determined to be on the order of ppm for Fe and In. The depth resolution is found to be about 20Å/spectrum with a laser power of 0.5 J/cm2. We also report a preliminary application of the LIMS to identifying impurities resident in several solid samples.

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What this paper is about

We have built a laser ionization mass spectrometer (LIMS) for chemical composition analysis of solid samples, which employs an Nd:YAG laser and a time-of-flight mass analyzer. In this spectrometer, the maximum mass we identified clearly is higher than 2000 amu. A mass resolution of 230 has been achieved at m/z 208 (Pb element) in the linear TOFMS and can be even improved up to 1550 by employing a reflectron. The detection limit is determined to be on the order of ppm for Fe and In. The depth resolution is found to be about 20Å/spectrum with a laser power of 0.5 J/cm2. We also report a preliminary application of the LIMS to identifying impurities resident in several solid samples.

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Available abstract

We have built a laser ionization mass spectrometer (LIMS) for chemical composition analysis of solid samples, which employs an Nd:YAG laser and a time-of-flight mass analyzer. In this spectrometer, the maximum mass we identified clearly is higher than 2000 amu. A mass resolution of 230 has been achieved at m/z 208 (Pb element) in the linear TOFMS and can be even improved up to 1550 by employing a reflectron. The detection limit is determined to be on the order of ppm for Fe and In. The depth resolution is found to be about 20Å/spectrum with a laser power of 0.5 J/cm2. We also report a preliminary application of the LIMS to identifying impurities resident in several solid samples.

Key concepts: Reflectron, Mass spectrometry, Laser, Hybrid mass spectrometer, Ionization, Analytical Chemistry (journal), Spectrometer, Resolution (logic)

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