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Reliability Technology for SiGe HBT's

Xiaowen Zhang

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Abstract

Characteristics of SiGe heterojunction bipolar transistors(HBT) are summarized.Physical mechanisms of SiGe HBT's are discussed,and potential factors to affect SiGe HBT's reliability are described in detail.Finally,methods for reliability accelerated life test of SiGe HBT's are summarized and a comparison is made between these techniques.

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What this paper is about

Characteristics of SiGe heterojunction bipolar transistors(HBT) are summarized.Physical mechanisms of SiGe HBT's are discussed,and potential factors to affect SiGe HBT's reliability are described in detail.Finally,methods for reliability accelerated life test of SiGe HBT's are summarized and a comparison is made between these techniques.

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Available abstract

Characteristics of SiGe heterojunction bipolar transistors(HBT) are summarized.Physical mechanisms of SiGe HBT's are discussed,and potential factors to affect SiGe HBT's reliability are described in detail.Finally,methods for reliability accelerated life test of SiGe HBT's are summarized and a comparison is made between these techniques.

Key concepts: Heterojunction bipolar transistor, Reliability (semiconductor), Materials science, Heterojunction, Bipolar junction transistor, Optoelectronics, Reliability engineering, Silicon-germanium

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