The Study of Testing Generation Method for Mixed-Signal Circuits
Qingyao Xu, Shaohui Cui, Dan Fang, Han Lu-jie, Changbin Xu
Abstract
Qingyao Xu, Shaohui Cui, Dan Fang, Han Lu-jie, Changbin Xu
Abstract
Test generation method for mixed-signal circuits is the key and the difficulty of the study of mixed-signal circuits. Most research is to the analog part, or takes the analog part and digital part as independent circuits. In this paper, the mixed-signal circuit is considered as an entity, we analyses the constraint of analog part and digital part, clarify the principle of activating and propagating the fault in mixed-signal circuit, propose a new Boolean Satisfiability with constraint. In the end, through simulation of examples, the results show the efficiency of the method.
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Test generation method for mixed-signal circuits is the key and the difficulty of the study of mixed-signal circuits. Most research is to the analog part, or takes the analog part and digital part as independent circuits. In this paper, the mixed-signal circuit is considered as an entity, we analyses the constraint of analog part and digital part, clarify the principle of activating and propagating the fault in mixed-signal circuit, propose a new Boolean Satisfiability with constraint. In the end, through simulation of examples, the results show the efficiency of the method.
Key concepts: Mixed-signal integrated circuit, Analogue electronics, Computer science, Electronic circuit, SIGNAL (programming language), Constraint (computer-aided design), Digital electronics, Electronic engineering