Replacing Basic Reliability Demonstration with Mission Success Probability Testing
Ding Ding-ha
Abstract
Ding Ding-ha
Abstract
It is suggested to replace the basic reliability demonstrating tests with mission success probability demonstrating tests that integrate reliability, maintainability and supportability into one design. Basic reliability can only indicate the failure rate of device under test and cannot provide any useful information for mission reliability, maintainability and supportability. Mission success probability tests can demonstrate the sustaining mission supportability in the life cycle and are effective means for improving reliability and implementing testability, maintainability and supportability.
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It is suggested to replace the basic reliability demonstrating tests with mission success probability demonstrating tests that integrate reliability, maintainability and supportability into one design. Basic reliability can only indicate the failure rate of device under test and cannot provide any useful information for mission reliability, maintainability and supportability. Mission success probability tests can demonstrate the sustaining mission supportability in the life cycle and are effective means for improving reliability and implementing testability, maintainability and supportability.
Key concepts: Maintainability, Reliability engineering, Testability, Reliability (semiconductor), Engineering, Failure rate, Computer science, Quantum mechanics