A testing system for VME modules based on Vx Works and PowerPC
Zhu Hai-tao, Chu Yuan-ping, Zhu Ke-jun, Zhao Jing-wei, Lei Guang-kun, Tao Ning
Abstract
Zhu Hai-tao, Chu Yuan-ping, Zhu Ke-jun, Zhao Jing-wei, Lei Guang-kun, Tao Ning
Abstract
This paper introduces the design and functions of a testing system for VME modules based on VxWorks and PowerPC.This testing system enables hardware developers to debug and test their common VME module operations,including read/write on VMEbus,CBLT(Chained Block Transfer),MCST(Multicast) and IACK(Interrupt Acknowledge).This testing system is adopted to debug and test the VME modules in the electronic system of BES III(Beijing Spectrometer III),improving the efficiency of electronic hardware development and debugging.
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This paper introduces the design and functions of a testing system for VME modules based on VxWorks and PowerPC.This testing system enables hardware developers to debug and test their common VME module operations,including read/write on VMEbus,CBLT(Chained Block Transfer),MCST(Multicast) and IACK(Interrupt Acknowledge).This testing system is adopted to debug and test the VME modules in the electronic system of BES III(Beijing Spectrometer III),improving the efficiency of electronic hardware development and debugging.
Key concepts: VMEbus, PowerPC, Debugging, Embedded system, Operating system, Computer science, Backplane, Automatic test equipment