2010•Hedianzixue yu tance jishuRequires access

The Analysis of CCD Sensitive Parameters Degraded by Radiation Damage

Yong Zhang

Abstract

The sensitive parameters which are degraded by radiation damage are researched.It is analyzed that charge transfer efficiency(CTE) is decreased by irradiation of different particles.CTEs are listed to contrast degradation before and after radiation.It is analyzed that the radiation damage induces the dark current increase,the flatband voltage and the threshold shift.The damage thresholds of CCD sensitive parameters are primary decided.

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Key concepts: Radiation damage, Irradiation, Radiation, Degradation (telecommunications), Materials science, Optoelectronics, Voltage, Optics