2004Cailiao kexue yu gongcheng xuebaoRequires access

Study of the Preparation and Properties of Nano-structure Hydrophobic and Anti-reflective Silica Films

Yao Lan-fang

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Abstract

Silicate sols were obtained from tetraethoxysilane (TEOS) dissolved in ethanol in base catalyzed system by sol-gel process. Both hydrophobic and anti-reflective silica films were prepared by the dip-coating technique from the sols and surface modification. As a result, the moisture-resistant ability of anti-reflective coating was highly improved. Ellipsometry, FTIR, UV-VIS-NIR spectrophotometry and contact angle instrument are used to measure the physical properties of the films.

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What this paper is about

Silicate sols were obtained from tetraethoxysilane (TEOS) dissolved in ethanol in base catalyzed system by sol-gel process. Both hydrophobic and anti-reflective silica films were prepared by the dip-coating technique from the sols and surface modification. As a result, the moisture-resistant ability of anti-reflective coating was highly improved. Ellipsometry, FTIR, UV-VIS-NIR spectrophotometry and contact angle instrument are used to measure the physical properties of the films.

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Available abstract

Silicate sols were obtained from tetraethoxysilane (TEOS) dissolved in ethanol in base catalyzed system by sol-gel process. Both hydrophobic and anti-reflective silica films were prepared by the dip-coating technique from the sols and surface modification. As a result, the moisture-resistant ability of anti-reflective coating was highly improved. Ellipsometry, FTIR, UV-VIS-NIR spectrophotometry and contact angle instrument are used to measure the physical properties of the films.

Key concepts: Materials science, Contact angle, Ellipsometry, Coating, Silicate, Fourier transform infrared spectroscopy, Sol-gel, Chemical engineering

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