Lu Si
Abstract
With the increase of the scale of integrated circuits, design for testability of IC's is becoming more and more important General design for testability techniques are reviewed in the paper, and strategies for testability design of blocks and chips in SOC design are discussed, respectively
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
With the increase of the scale of integrated circuits, design for testability of IC's is becoming more and more important General design for testability techniques are reviewed in the paper, and strategies for testability design of blocks and chips in SOC design are discussed, respectively
Key concepts: Testability, Design for testing, Reliability engineering, Computer science, Computer architecture, Engineering, Integrated circuit design, Embedded system