2008Guangdian gongchengRequires access

Design of CMOS Process Compatible Photodetectors for Fluorescence Detecting Application

Zhiliang Hong

Open publisher page 1 citations

Abstract

Three kinds of CMOS compatible photosensors, P+/Nwell photodetector, Nwell/Psub photodetector and N+/Psub photodetector, were designed by using SMIC 0.18μm standard CMOS technology. Some critical parameters, such as responsivity, dark current and maximal response wavelength were analyzed based on the mathematic model established. The influences of some technology parameters, such as doping concentration, junction depth, were pointed out as well. The experiment results indicate that P+/Nwell photodetector can reach a maximal sensitivity of 0.08 A/W at 460nm with 55nA/cm2 dark current, Nwell/Psub photodetector has a maximal sensitivity of 0.35A/W at 580nm with 64nA/cm2 dark current and N+/Psub photodetector attains a maximal sensitivity of 0.29 A/W at 580nm with 600nA/cm2 dark current. The test results show that the photodetectors designed agree with theoretical analysis basically and have prominent performance on sensitivity and response wavelength.

About this research paper

What this paper is about

Three kinds of CMOS compatible photosensors, P+/Nwell photodetector, Nwell/Psub photodetector and N+/Psub photodetector, were designed by using SMIC 0.18μm standard CMOS technology. Some critical parameters, such as responsivity, dark current and maximal response wavelength were analyzed based on the mathematic model established. The influences of some technology parameters, such as doping concentration, junction depth, were pointed out as well. The experiment results indicate that P+/Nwell photodetector can reach a maximal sensitivity of 0.08 A/W at 460nm with 55nA/cm2 dark current, Nwell/Psub photodetector has a maximal sensitivity of 0.35A/W at 580nm with 64nA/cm2 dark current and N+/Psub photodetector attains a maximal sensitivity of 0.29 A/W at 580nm with 600nA/cm2 dark current. The test results show that the photodetectors designed agree with theoretical analysis basically and have prominent performance on sensitivity and response wavelength.

Why it matters

OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Three kinds of CMOS compatible photosensors, P+/Nwell photodetector, Nwell/Psub photodetector and N+/Psub photodetector, were designed by using SMIC 0.18μm standard CMOS technology. Some critical parameters, such as responsivity, dark current and maximal response wavelength were analyzed based on the mathematic model established. The influences of some technology parameters, such as doping concentration, junction depth, were pointed out as well. The experiment results indicate that P+/Nwell photodetector can reach a maximal sensitivity of 0.08 A/W at 460nm with 55nA/cm2 dark current, Nwell/Psub photodetector has a maximal sensitivity of 0.35A/W at 580nm with 64nA/cm2 dark current and N+/Psub photodetector attains a maximal sensitivity of 0.29 A/W at 580nm with 600nA/cm2 dark current. The test results show that the photodetectors designed agree with theoretical analysis basically and have prominent performance on sensitivity and response wavelength.

Key concepts: Photodetector, Responsivity, Dark current, Optoelectronics, Sensitivity (control systems), CMOS, Materials science, Wavelength

Related papers

Back to paper searchBrowse research topicsOriginal source
Design of CMOS Process Compatible Photodetectors for Fluorescence Detecting Application — Research Paper | ScholarLens