Strain-induced Crystallization Behavior of Amorphous PEEK Prepared by Rapid Compression

The crystallization behavior of poly(ether-ether-ketone)(PEEK) prepared by rapid compression(RC) and quenched cold(QC) drawn at different drawing temperatures(Td) and drawing speeds(v) were studied by wide angl X-ray diffraction(WAXD).The results show that the critical crystallization strains of RC samples are lower than that of QC samples under the same drawing conditions and reduced with drawing temperature and speed increasing.The crystallinity of samples drawn under the same temperature changed unconspicuously with the drawing speed increasing.Moreover,as drawing temperature increased,the crystallinity is improved obviously.The results show that crystallinity depends on drawing temperature mainly.