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2011•Journal of Naval University of EngineeringRequires access

Generalized binomial sequential sampling inspection

Haitao Liu

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Abstract

For reliability demonstration test of countable product,a scheme was presented for a gene-ralized binomial sequential sampling test.By constructing a Markov chain model,a method for calculating risks was proposed,based on which a procedure of constituting a sequential mesh test scheme was given.The result shows that the generalized binomial sequential sampling test is better than the international standard IEC1123.

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What this paper is about

For reliability demonstration test of countable product,a scheme was presented for a gene-ralized binomial sequential sampling test.By constructing a Markov chain model,a method for calculating risks was proposed,based on which a procedure of constituting a sequential mesh test scheme was given.The result shows that the generalized binomial sequential sampling test is better than the international standard IEC1123.

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Available abstract

For reliability demonstration test of countable product,a scheme was presented for a gene-ralized binomial sequential sampling test.By constructing a Markov chain model,a method for calculating risks was proposed,based on which a procedure of constituting a sequential mesh test scheme was given.The result shows that the generalized binomial sequential sampling test is better than the international standard IEC1123.

Key concepts: Markov chain, Binomial distribution, Binomial (polynomial), Mathematics, Sampling (signal processing), Statistics, Negative binomial distribution, Sequential analysis

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