Measurement of the elasticooptic effect of crystal using white light interferometer
Xing Jin-hua
Abstract
Xing Jin-hua
Abstract
Starting from the index ellipsoid,the elasticooptic effect of crystal is analyzed.An improved method using white-light interferometry Michelson interferometer to measure group refractive index is introduced,using grating displacement sensor to increase the displacement precision of scanning mirrow.The change of quartz crystal refractive index is measured under the different outside force,and the elasticooptic coefficient is determined.
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Starting from the index ellipsoid,the elasticooptic effect of crystal is analyzed.An improved method using white-light interferometry Michelson interferometer to measure group refractive index is introduced,using grating displacement sensor to increase the displacement precision of scanning mirrow.The change of quartz crystal refractive index is measured under the different outside force,and the elasticooptic coefficient is determined.
Key concepts: Optics, Interferometry, Michelson interferometer, Refractive index, White light interferometry, Displacement (psychology), Grating, Crystal (programming language)