Research on Testing Technology of Logic Elements in FPGA

FPGA is widely used in the field of integrated circuit design,system on chip.With the extensive application of FPGA,the dependability of the FPGA is very complex,also it is harder and more expensive.The logic unit structure of type SRAM-based FPGA is introdueced,and a traversal test method based on the scan chain is presented.As an example of Altera's Cyclone series FPGA,the implementation method of online configuration and function test of the FPGA in the VLSI Test System CATT-400 is described.