A Bayesian scheme of acceptance test for success or failure mould product
Zhihua Zhang
Abstract
Zhihua Zhang
Abstract
Based on the test for reliability appraisal, the hierarchical Bayesian method is used to decide the prior distribution of the reliability indices, so that a new Beyesian sampling scheme is got for success or failure mould product in the acceptance test. Thereby, the prior information in the product type test is utilized more sufficiently, and the volume of test work is reduced considerably in comparison with the traditional acceptance test under presupposition of quality assurance. Furthermore, the economical effect is gained.
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Based on the test for reliability appraisal, the hierarchical Bayesian method is used to decide the prior distribution of the reliability indices, so that a new Beyesian sampling scheme is got for success or failure mould product in the acceptance test. Thereby, the prior information in the product type test is utilized more sufficiently, and the volume of test work is reduced considerably in comparison with the traditional acceptance test under presupposition of quality assurance. Furthermore, the economical effect is gained.
Key concepts: Test (biology), Reliability engineering, Bayesian probability, Reliability (semiconductor), Product (mathematics), Acceptance sampling, Computer science, Scheme (mathematics)