Research on feasibility of accelerated degradation test for aerospace electrical connector
Pan Jun
Abstract
Pan Jun
Abstract
As few or no failures occur during accelerated life test for aerospace electrical connector,which is high reliable and long-lifetime,it is difficult to assess reliability with traditional life test methods.Failure mode and contact performance variation of electrical connector in long-term storage condition was analyzed;the possibility of the performance degradation of the electrical connector was illustrated,which was proved by the test data of electrical connector in long-term storage.Then by analyzing the contact performance data under temperature accelerated stress,the accelerated ability of electrical connector performance degradation was demonstrated,and the authors deduce the law of performance degradation for aerospace electrical connector.
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As few or no failures occur during accelerated life test for aerospace electrical connector,which is high reliable and long-lifetime,it is difficult to assess reliability with traditional life test methods.Failure mode and contact performance variation of electrical connector in long-term storage condition was analyzed;the possibility of the performance degradation of the electrical connector was illustrated,which was proved by the test data of electrical connector in long-term storage.Then by analyzing the contact performance data under temperature accelerated stress,the accelerated ability of electrical connector performance degradation was demonstrated,and the authors deduce the law of performance degradation for aerospace electrical connector.
Key concepts: Cable gland, Degradation (telecommunications), Reliability (semiconductor), Aerospace, Electrical contacts, Reliability engineering, Contact resistance, Failure mode and effects analysis