Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs
LI Wen-chan
Abstract
LI Wen-chan
Abstract
The FPGA(Field Programmable Gate the Arrays),as the most widely used programmable devices,are favored by more and more people due to their wealthy internal resources and good performance.However,the issue of FPGA reliability has received increasingly attention.A fault testing and diagnosis technique for both interconnect resources and CLBs in Virtex series FPGAs is presented in the paper.Experimental results demonstrate that the proposed testing and diagnosis method is applicable to the Virtex series FPGAs.
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The FPGA(Field Programmable Gate the Arrays),as the most widely used programmable devices,are favored by more and more people due to their wealthy internal resources and good performance.However,the issue of FPGA reliability has received increasingly attention.A fault testing and diagnosis technique for both interconnect resources and CLBs in Virtex series FPGAs is presented in the paper.Experimental results demonstrate that the proposed testing and diagnosis method is applicable to the Virtex series FPGAs.
Key concepts: Field-programmable gate array, Virtex, Computer science, Reliability (semiconductor), Interconnection, Embedded system, Series (stratigraphy), Reconfigurable computing