2009•Journal of Minjiang UniversityRequires access

Design of resistance and temperature measurement system based on LabVIEW

Peng Zi-ran

Abstract

Using data acquisition card PCI-6014,programming with LabVIEW,we can set up a virtual instrument data acquisition system.This system includes the lower position machine hardware part,which is mainly constructed in the PCI-6014.The software system part,using LabVIEW and Measurement Automation is included.This system can perform simultaneously gathering the thin film's resistance and temperature,and real-time display profile and gathering data point.

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Key concepts: Data acquisition, Virtual instrument, Computer science, Software, Computer hardware, Embedded system, Automation, Virtual instrumentation