de Broglie wave-front curvature induced by electric-field gradients and its effect on precision measurements with an atom interferometer

To improve precision measurements made with atom interferometers, the effect of de Broglie wave-front curvature induced by a lens inside an atom interferometer is experimentally demonstrated and theoretically analyzed. Electrostatic lenses shift, magnify, and distort atom interference fringes, which modifies the phase and the contrast of the interference signals. Informed by these observations, an improved method is presented for analyzing measurements of atomic beam velocity distributions using phase choppers [W. F. Holmgren, I. Hromada, C. E. Klauss, and A. D. Cronin, New J. Phys. 13, 115007 (2011)].