2013The Journal of Physical Chemistry CRequires access

Catalyst-Free Heteroepitaxial MOCVD Growth of InAs Nanowires on Si Substrates

Yi Jing, Xinyu Bao, Wei Wei, Chun Li, Ke Sun, David P. R. Aplin, Yong Ding, Zhong Lin Wang, Yoshio Bando, Deli Wang

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Abstract

We report the systematic study of catalyst-free syntheses of InAs nanowires on Si substrates with various growth parameters and surface treatments. Nanowire morphology and crystal structure were studied using scanning electron microscopy and transmission electron microscopy. High-resolution cross-sectional transmission electron microscopy studies reveal heteroepitaxy of InAs[111] nanowires on Si(111) substrate with clean and sharp interface. Single nanowire field-effect transistor measurements of InAs nanowires under optimal growth conditions indicate a typical electron concentration of 10 18 –10 19 cm –3 and mobility of around 1000 cm 2 /V·s. III/V on Si devices with InAs nanowire array on p-Si show a broadband photodetection up to wavelength of 3.5 μm.

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What this paper is about

We report the systematic study of catalyst-free syntheses of InAs nanowires on Si substrates with various growth parameters and surface treatments. Nanowire morphology and crystal structure were studied using scanning electron microscopy and transmission electron microscopy. High-resolution cross-sectional transmission electron microscopy studies reveal heteroepitaxy of InAs[111] nanowires on Si(111) substrate with clean and sharp interface. Single nanowire field-effect transistor measurements of InAs nanowires under optimal growth conditions indicate a typical electron concentration of 10 18 –10 19 cm –3 and mobility of around 1000 cm 2 /V·s. III/V on Si devices with InAs nanowire array on p-Si show a broadband photodetection up to wavelength of 3.5 μm.

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Available abstract

We report the systematic study of catalyst-free syntheses of InAs nanowires on Si substrates with various growth parameters and surface treatments. Nanowire morphology and crystal structure were studied using scanning electron microscopy and transmission electron microscopy. High-resolution cross-sectional transmission electron microscopy studies reveal heteroepitaxy of InAs[111] nanowires on Si(111) substrate with clean and sharp interface. Single nanowire field-effect transistor measurements of InAs nanowires under optimal growth conditions indicate a typical electron concentration of 10 18 –10 19 cm –3 and mobility of around 1000 cm 2 /V·s. III/V on Si devices with InAs nanowire array on p-Si show a broadband photodetection up to wavelength of 3.5 μm.

Key concepts: Nanowire, Materials science, Transmission electron microscopy, Metalorganic vapour phase epitaxy, Optoelectronics, Substrate (aquarium), Epitaxy, Nanotechnology

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