1994IEEJ Transactions on Industry ApplicationsOpen access

High-Speed and Transparent Fault-Tolerance by Intra-Board Faul-Masking.

Nobuyasu Kanekawa, Shinichiro Yamaguchi, Hiroaki Fukumaru, Takeshi Miyao

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Key concepts: Fault tolerance, Redundancy (engineering), Computer science, Software fault tolerance, Transparency (behavior), Embedded system, Reliability engineering, Distributed computing

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