ScholarLens Back to search
1987•Acta Crystallographica Section A Foundations of CrystallographyOpen access

High-resolution diffuse X-ray scattering study of defect structure in silicon single crystals by exploring reciprocal space around different lattice points with a four-crystal X-ray diffractometer

K. Lal, G. Bhagavannarayana

Open full text 0 citations

Abstract

Point defect aggregates in nearly perfect single crystals produce anisotropic diffuse X-ray scattering (DXS) from reciprocal space around reciprocal lattice points (relps) (Krishan Lal in synthesis, Crystal Growth and

Open-access reader

About this research paper

What this paper is about

Point defect aggregates in nearly perfect single crystals produce anisotropic diffuse X-ray scattering (DXS) from reciprocal space around reciprocal lattice points (relps) (Krishan Lal in synthesis, Crystal Growth and

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Point defect aggregates in nearly perfect single crystals produce anisotropic diffuse X-ray scattering (DXS) from reciprocal space around reciprocal lattice points (relps) (Krishan Lal in synthesis, Crystal Growth and

Key concepts: Reciprocal lattice, Diffractometer, X-ray, Materials science, Silicon, Crystallography, Scattering, Single crystal

Related papers

Related paper 1Related paper 2
Back to paper searchBrowse research topicsOriginal source
High-resolution diffuse X-ray scattering study of defect structure in silicon single crystals by exploring reciprocal space around different lattice points with a four-crystal X-ray diffractometer — Research Paper | ScholarLens