2016Communication in Statistics- Theory and MethodsRequires access

The E-Bayesian and hierarchical Bayesian estimations for the system reliability parameter

Han Ming

Open publisher page 21 citations

Abstract

Han introduced an E-Bayesian estimation method for estimating a system failure probability and revealed the relationship between the E-Bayesian estimates under three different prior distributions of hyperparameters in 2007. In this article, formulas of the hierarchical Bayesian estimation of a system failure probability are investigated and, furthermore, the relationship between hierarchical Bayesian estimation and E-Bayesian estimation is discussed. Finally, numerical example and application example are provided for illustrative purpose.

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What this paper is about

Han introduced an E-Bayesian estimation method for estimating a system failure probability and revealed the relationship between the E-Bayesian estimates under three different prior distributions of hyperparameters in 2007. In this article, formulas of the hierarchical Bayesian estimation of a system failure probability are investigated and, furthermore, the relationship between hierarchical Bayesian estimation and E-Bayesian estimation is discussed. Finally, numerical example and application example are provided for illustrative purpose.

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OpenAlex reports 21 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Han introduced an E-Bayesian estimation method for estimating a system failure probability and revealed the relationship between the E-Bayesian estimates under three different prior distributions of hyperparameters in 2007. In this article, formulas of the hierarchical Bayesian estimation of a system failure probability are investigated and, furthermore, the relationship between hierarchical Bayesian estimation and E-Bayesian estimation is discussed. Finally, numerical example and application example are provided for illustrative purpose.

Key concepts: Bayesian probability, Bayesian hierarchical modeling, Reliability (semiconductor), Computer science, Bayesian statistics, Statistics, Data mining, Bayesian inference

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