Metrology for Manufacturing of Freeform Optical Surfaces with UltraSurf
Scott DeFisher
Abstract
Scott DeFisher
Abstract
Measuring freeform surfaces at all stages of manufacturing is critically important. UltraSurf is a non-contact measurement system designed to address the complications of freeform metrology. Methodology, challenges, and results with UltraSurf will be presented.
OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Measuring freeform surfaces at all stages of manufacturing is critically important. UltraSurf is a non-contact measurement system designed to address the complications of freeform metrology. Methodology, challenges, and results with UltraSurf will be presented.
Key concepts: Metrology, Manufacturing engineering, Computer science, Engineering drawing, Engineering, Mechanical engineering, Materials science, Optics