Reliability, maintainability, availability and failure rate analysis of IGBT triggering system designed for marine environment
H. H. Memon, Mahmudul Alam
Abstract
H. H. Memon, Mahmudul Alam
Abstract
The High voltage static converter systems are deployed at different military and DoD assets in which power electronics is used for the isolated and stabilized AC or DC voltage/frequency conversion process and the Insulated Gate Bipolar Transistor (IGBT) triggering system plays crucial role in such systems. Such type of systems and equipments are being operated by the combat deployed personnel and they rely upon in order to complete their critical missions. Therefore, it is evident that reliability and availability during the mission and maintainability of the system before and after the mission is paramount. The objective of this paper is to present the predicted Reliability, Maintainability, Availability and Failure rate analysis of the IGBT triggering system. The analysis is made in the marine environment by defining specific parameters. The method used to calculate the reliability prediction of the IGBT triggering system is based on the calculation of Mean Time Between Failure (MTBF), which is obtained from the calculation of Failure rate of individual components used in the system. The maintainability analysis is done based on the length of the time required by the repairable components, repair through replaceable components or replacing the whole system. Therefore, this analysis will use the Mean Time To Repair (MTTR). MTBF and MTTR are used as key elements in the availability analysis of the system. Pareto analysis is presented in order to show the individual components failure rate contribution used in the system. The presented analysis shows the relationship between reliability, maintainability and availability of a system and also shows how the reliability and maintainability analysis improves the availability of the designed system. The presented analysis can be viewed with reference to system lifetime calculation as it will help in investment plan of designed system in marine environment.
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The High voltage static converter systems are deployed at different military and DoD assets in which power electronics is used for the isolated and stabilized AC or DC voltage/frequency conversion process and the Insulated Gate Bipolar Transistor (IGBT) triggering system plays crucial role in such systems. Such type of systems and equipments are being operated by the combat deployed personnel and they rely upon in order to complete their critical missions. Therefore, it is evident that reliability and availability during the mission and maintainability of the system before and after the mission is paramount. The objective of this paper is to present the predicted Reliability, Maintainability, Availability and Failure rate analysis of the IGBT triggering system. The analysis is made in the marine environment by defining specific parameters. The method used to calculate the reliability prediction of the IGBT triggering system is based on the calculation of Mean Time Between Failure (MTBF), which is obtained from the calculation of Failure rate of individual components used in the system. The maintainability analysis is done based on the length of the time required by the repairable components, repair through replaceable components or replacing the whole system. Therefore, this analysis will use the Mean Time To Repair (MTTR). MTBF and MTTR are used as key elements in the availability analysis of the system. Pareto analysis is presented in order to show the individual components failure rate contribution used in the system. The presented analysis shows the relationship between reliability, maintainability and availability of a system and also shows how the reliability and maintainability analysis improves the availability of the designed system. The presented analysis can be viewed with reference to system lifetime calculation as it will help in investment plan of designed system in marine environment.
Key concepts: Mean time between failures, Maintainability, Reliability engineering, Failure rate, Reliability (semiconductor), Insulated-gate bipolar transistor, Maintenance engineering, Engineering