2008Unpublished venueRequires access

Genetic Variability and Heritability in Bread Wheat

Jitendra Kumar

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Abstract

16 parents and 56 crosses in bread wheat (Triticum aestivum L.) was studied under three different environments. Highly significant variances were observed among parents and their F1S for all the characters at all the three locations except for plant height. The direct selection revealed low estimates of heritability for grain yield and flag leaf sheath area, medium for peduncle area, spike area, productive tillers per plant, spike length, productive tillers per plant, spike length, spikelet's per spike and high for plant height, 100 grain weight, days to maturity, number of seeds per spike and flag leaf area. Expected genetic advance was considerable for plant height, flag leaf area, days to maturity and spike area. The lowest genetic advance was observed for grain yield.

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What this paper is about

16 parents and 56 crosses in bread wheat (Triticum aestivum L.) was studied under three different environments. Highly significant variances were observed among parents and their F1S for all the characters at all the three locations except for plant height. The direct selection revealed low estimates of heritability for grain yield and flag leaf sheath area, medium for peduncle area, spike area, productive tillers per plant, spike length, productive tillers per plant, spike length, spikelet's per spike and high for plant height, 100 grain weight, days to maturity, number of seeds per spike and flag leaf area. Expected genetic advance was considerable for plant height, flag leaf area, days to maturity and spike area. The lowest genetic advance was observed for grain yield.

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Available abstract

16 parents and 56 crosses in bread wheat (Triticum aestivum L.) was studied under three different environments. Highly significant variances were observed among parents and their F1S for all the characters at all the three locations except for plant height. The direct selection revealed low estimates of heritability for grain yield and flag leaf sheath area, medium for peduncle area, spike area, productive tillers per plant, spike length, productive tillers per plant, spike length, spikelet's per spike and high for plant height, 100 grain weight, days to maturity, number of seeds per spike and flag leaf area. Expected genetic advance was considerable for plant height, flag leaf area, days to maturity and spike area. The lowest genetic advance was observed for grain yield.

Key concepts: Heritability, Peduncle (anatomy), Flag (linear algebra), Biology, Spike (software development), Forensic science, Grain yield, Yield (engineering)

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