2015•Surface ScienceRequires access

Surface potential measurements of 2 × 1 reconstructed Si(001) using UHV Kelvin probe force microscopy

Sangyeob Lee

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Key concepts: Kelvin probe force microscope, Work function, Surface photovoltage, Volta potential, Band bending, Surface reconstruction, Microscopy, Chemistry

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Surface potential measurements of 2 × 1 reconstructed Si(001) using UHV Kelvin probe force microscopy — Research Paper | ScholarLens