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2015•Unpublished venueRequires access

Variability parameters, correlation and path analysis in wheat varieties for yield and its components.

Sravan Kumar Yeturu, R. A. S. Lamba, Vinod Kumar, Balbir Singh

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Key concepts: Path analysis (statistics), Yield (engineering), Agronomy, Correlation, Crop yield, Mathematics, Path coefficient, Statistics

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Variability parameters, correlation and path analysis in wheat varieties for yield and its components. — Research Paper | ScholarLens