2008•대한전자공학회 학술대회Requires access

3차원 SPICE 회로모델을 이용한 LED 신뢰성 분석

김진환, 유순재, 서종욱

Abstract

A SPICE-based 3-dimensional circuit model of Light-Emitting Diode(LED) was modified include the reverse breakdown properties. The new model is found to be accurate to study the failure mechanisms of LEDs under electrostatic discharge (ESD) and electronic overstress (EOS). It was found that the permanent damages under heavy reverse stress is mainly due to the high electric field strength in P-GaN layer.

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Available abstract

Key concepts: Spice, Electrostatic discharge, Light-emitting diode, Materials science, Electric field, Optoelectronics, Stress (linguistics), Short circuit