1981Physical Review LettersRequires access

Experimental S F6− /S F6 and Cl− /CF Cl3 Electron-Attachment Cross Sections in the Energy Range 0-200 meV

A. Chutjian

Open publisher page 68 citations

Abstract

Experimental cross sections for the electron-attachment processes for S${\mathrm{F}}_{6}^{\ensuremath{-}}$/S${\mathrm{F}}_{6}$ and ${\mathrm{Cl}}^{\ensuremath{-}}$/CF${\mathrm{Cl}}_{3}$ are reported in the energy range 0-200 meV by normalizing each attachment line shape to measurement of a thermal rate coefficient. When the same ion states are detected, good agreement is found between present values, for which a monoenergetic electron source is used, and swarm-unfolded results. The present data constitute a new limit for cross sections reported at high resolution at the lowest electron energy.

About this research paper

What this paper is about

Experimental cross sections for the electron-attachment processes for S${\mathrm{F}}_{6}^{\ensuremath{-}}$/S${\mathrm{F}}_{6}$ and ${\mathrm{Cl}}^{\ensuremath{-}}$/CF${\mathrm{Cl}}_{3}$ are reported in the energy range 0-200 meV by normalizing each attachment line shape to measurement of a thermal rate coefficient. When the same ion states are detected, good agreement is found between present values, for which a monoenergetic electron source is used, and swarm-unfolded results. The present data constitute a new limit for cross sections reported at high resolution at the lowest electron energy.

Why it matters

OpenAlex reports 68 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Experimental cross sections for the electron-attachment processes for S${\mathrm{F}}_{6}^{\ensuremath{-}}$/S${\mathrm{F}}_{6}$ and ${\mathrm{Cl}}^{\ensuremath{-}}$/CF${\mathrm{Cl}}_{3}$ are reported in the energy range 0-200 meV by normalizing each attachment line shape to measurement of a thermal rate coefficient. When the same ion states are detected, good agreement is found between present values, for which a monoenergetic electron source is used, and swarm-unfolded results. The present data constitute a new limit for cross sections reported at high resolution at the lowest electron energy.

Key concepts: Physics, Energy (signal processing), Line (geometry), Ion, Atomic physics, Crystallography, Chemistry, Geometry

Related papers

Back to paper searchBrowse research topicsOriginal source
Experimental S F6− /S F6 and Cl− /CF Cl3 Electron-Attachment Cross Sections in the Energy Range 0-200 meV — Research Paper | ScholarLens