Performance measures for systems under multiple environments
Baoliang Liu, Lirong Cui, Shubin Si, Yanqing Wen
Abstract
Baoliang Liu, Lirong Cui, Shubin Si, Yanqing Wen
Abstract
In this paper, the system which operates in multiple environments is studied. The environment process is governed by a Markov process, and the deterioration process is governed by another Markov process given the system in a certain environment. In terms of the above two processes, a new Markov process is constructed to represent the evolution of the system. In terms of Ion-Channel modeling theory, Markov process theory and matrix partition method, some reliability indexes for the system are obtained, i.e., system reliability, environment reliability, system multiple-interval reliability, system availability, environment availability, system multiple-point availability, etc. Finally, a numerical example is given to illustrate the results obtained in the paper.
OpenAlex reports 11 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
In this paper, the system which operates in multiple environments is studied. The environment process is governed by a Markov process, and the deterioration process is governed by another Markov process given the system in a certain environment. In terms of the above two processes, a new Markov process is constructed to represent the evolution of the system. In terms of Ion-Channel modeling theory, Markov process theory and matrix partition method, some reliability indexes for the system are obtained, i.e., system reliability, environment reliability, system multiple-interval reliability, system availability, environment availability, system multiple-point availability, etc. Finally, a numerical example is given to illustrate the results obtained in the paper.
Key concepts: Markov process, Markov chain, Reliability (semiconductor), Computer science, Process (computing), Markov model, Reliability engineering, Interval (graph theory)