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1997•한국진공학회 학술발표회초록집Requires access

A study of interface in Cu and TiN by x - ray photoelectron spectroscopy

Yong‐Duck Chung, Kwang Yong Lim, Y.S.Lee, B.S.Choi, S.O.Kim, C. N. Whang

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Key concepts: X-ray photoelectron spectroscopy, Tin, Interface (matter), X-ray spectroscopy, Materials science, Spectroscopy, Metallurgy, Physics

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