RF Cavity Induced Sensitivity Limitations on Beam Loss Monitors
Maria Kastriotou, A. Degiovanni, F.S. Domingues Sousa, Ewald Effinger, Eva Barbara Holzer, Jose Luis Navarro Quirante, E.N. del Busto, F. Tecker, William Viganó, Carsten Welsch, Ben Woolley
Abstract
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