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An Efficient Delay Test Method Using Boundary-Scan Architecture

Yong Min Hur, Keun Jang Ryoo, Jac Heung Shin, Young Oo Kim, Chul Won Lee, Yun Hong Kim, Jae Min Lee, In Chil Lim

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Key concepts: Computer science, Boundary scan, Test (biology), Architecture, Integrated circuit, Operating system, Art, Paleontology

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