2010Applied and numerical harmonic analysisRequires access

Refraction on Multilayers

Michel Mendès France, Ahmed Sebbar

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Abstract

Given an unknown number N of transparent plates stacked one onto the other of unknown thicknesses a k and unknown indices of refraction n k , it is possible to discover N, a k , n k by observing how incident beams of monochromatic light behave on the opposite side, at least if the measurements are very precise. But what if they are not?

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What this paper is about

Given an unknown number N of transparent plates stacked one onto the other of unknown thicknesses a k and unknown indices of refraction n k , it is possible to discover N, a k , n k by observing how incident beams of monochromatic light behave on the opposite side, at least if the measurements are very precise. But what if they are not?

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Available abstract

Given an unknown number N of transparent plates stacked one onto the other of unknown thicknesses a k and unknown indices of refraction n k , it is possible to discover N, a k , n k by observing how incident beams of monochromatic light behave on the opposite side, at least if the measurements are very precise. But what if they are not?

Key concepts: Monochromatic color, Refraction, Optics, Refractive index, Physics, Negative refraction, Materials science

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