PRELIMINARY RESULTS OF SPATIALLY RESOLVED ECR ION BEAM PROFILE INVESTIGATIONS
L. Panitzsch, Michael Stalder
Abstract
L. Panitzsch, Michael Stalder
Abstract
The profile of an ion beam produced in an Electron Cyclotron Resonance Ion Source (ECRIS) can vary greatly depending on the source settings and the ion-optical tuning. Strongly focussed ion beams form circular structures (hollow beams) as predicted by simulations [1] and observed in experiments [2] and [3]. Each of the rings is predicted to be dominated by ions with same or at least similar m/q-ratios due to ion-optical effects. To check thi s we performed a series of preliminary investigations to test the reqiured tuning capabilities of our ion source. This includes beam focussing (A) and beam steering (B) using a 3D-movable extraction. Having tuned the source to deliver a beam of strongly focussed ions of different ion species and having steered this beam to match the transmittance area of the sector magnet we also recorded the ion charge state distribution of the strongly focussed beam profile at different, spatially limited positions (C). The prelimina ry results will be introduced within this paper.
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The profile of an ion beam produced in an Electron Cyclotron Resonance Ion Source (ECRIS) can vary greatly depending on the source settings and the ion-optical tuning. Strongly focussed ion beams form circular structures (hollow beams) as predicted by simulations [1] and observed in experiments [2] and [3]. Each of the rings is predicted to be dominated by ions with same or at least similar m/q-ratios due to ion-optical effects. To check thi s we performed a series of preliminary investigations to test the reqiured tuning capabilities of our ion source. This includes beam focussing (A) and beam steering (B) using a 3D-movable extraction. Having tuned the source to deliver a beam of strongly focussed ions of different ion species and having steered this beam to match the transmittance area of the sector magnet we also recorded the ion charge state distribution of the strongly focussed beam profile at different, spatially limited positions (C). The prelimina ry results will be introduced within this paper.
Key concepts: Ion beam, Ion, Ion source, Beam (structure), Ion beam deposition, Ion gun, Atomic physics, Electron cyclotron resonance