High-precision analysis of hydrous rhyolitic glass inclusions in quartz phenocrysts using the electron microprobe and INAA

Other| October 01, 1996 High-precision analysis of hydrous rhyolitic glass inclusions in quartz phenocrysts using the electron microprobe and INAA Benjamin Hanson; Benjamin Hanson University of Albany, State University of New York, Albany, NY, United States Search for other works by this author on: GSW Google Scholar John W. Delano; John W. Delano Search for other works by this author on: GSW Google Scholar David J. Lindstrom David J. Lindstrom Search for other works by this author on: GSW Google Scholar Author and Article Information Benjamin Hanson University of Albany, State University of New York, Albany, NY, United States John W. Delano David J. Lindstrom Publisher: Mineralogical Society of America First Online: 02 Mar 2017 Online Issn: 1945-3027 Print Issn: 0003-004X Copyright © 1977 by the Mineralogical Society of America American Mineralogist (1996) 81 (9-10): 1249–1262. https://doi.org/10.2138/am-1996-9-1023 Article history First Online: 02 Mar 2017 Cite View This Citation Add to Citation Manager Share Icon Share Facebook Twitter LinkedIn MailTo Tools Icon Tools Get Permissions Search Site Citation Benjamin Hanson, John W. Delano, David J. Lindstrom; High-precision analysis of hydrous rhyolitic glass inclusions in quartz phenocrysts using the electron microprobe and INAA. American Mineralogist 1996;; 81 (9-10): 1249–1262. doi: https://doi.org/10.2138/am-1996-9-1023 Download citation file: Ris (Zotero) Refmanager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentBy SocietyAmerican Mineralogist Search Advanced Search Abstract A high-precision electron microprobe (EMP) technique has been developed that is capable of analyzing major, minor, and trace element abundances (Si, Ti, Al, Fe, Mn, Mg, Ca, Na, K, Cl) in hydrous rhyolitic glasses. The technique was developed to characterize the chemical compositions of rhyolitic glass inclusions in phenocrysts that occur in layers of Paleozoic altered volcanic ash. The compositions of these inclusions serve as excellent chemical "fingerprints" of the altered volcanic ash layers for use in stratigraphic correlation. The precision and reproducibility of the analyses is sufficient not only to distinguish one altered volcanic ash layer from another on the basis of inclusion compositions, but also to discern differences in the compositions of different inclusions from the same layer.A high-precision instrumental neutron activation analytical (INAA) technique was also developed that is capable of measuring an additional suite of trace elements (e.g., Sc, Co, Rb, Cs, Sr, Ba, La, Ce, Sm, Eu, Tb, Yb, Lu, Zr, Hf, Ta) in rhyolitic glass inclusions in quartz phenocrysts with excellent accuracy and precision after correcting for the presence of the host quartz. The abundances of elements measured by the EMP technique and the corrected abundances determined using the INAA technique are identical within analytical uncertainty, thus demonstrating the internal consistency of the results. This content is PDF only. Please click on the PDF icon to access. First Page Preview Close Modal You do not have access to this content, please speak to your institutional administrator if you feel you should have access.