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Stacking Velocity Analysis with CRS Stack Attributes

Steffen Bergler, Pedro Chira, J. Mann, K. Vieth, Peter Hubral

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Abstract

B-03 STACKING VELOCITY ANALYSIS WITH CRS STACK ATTRIBUTES S. BERGLER P. CHIRA J. MANN K. VIETH and P. HUBRAL Geophysical Institute University of Karlsruhe Hertzstr. 16 76187 Karlsruhe Germany Abstract The Common-Reflection-Surface (CRS) Stack has been established over the past years as an alternative to standard data-driven imaging techniques. The CRS Stack not only yields high-quality stack sections from multi-coverage reflection pre-stack data but also provides—as by-product to the stacked section— important wavefield attributes. With the knowledge of the near-surface velocity only these attributes can be extracted from the stacking parameters which constitute the Common-Reflection-Surface stacking operator. The wavefield attributes

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What this paper is about

B-03 STACKING VELOCITY ANALYSIS WITH CRS STACK ATTRIBUTES S. BERGLER P. CHIRA J. MANN K. VIETH and P. HUBRAL Geophysical Institute University of Karlsruhe Hertzstr. 16 76187 Karlsruhe Germany Abstract The Common-Reflection-Surface (CRS) Stack has been established over the past years as an alternative to standard data-driven imaging techniques. The CRS Stack not only yields high-quality stack sections from multi-coverage reflection pre-stack data but also provides—as by-product to the stacked section— important wavefield attributes. With the knowledge of the near-surface velocity only these attributes can be extracted from the stacking parameters which constitute the Common-Reflection-Surface stacking operator. The wavefield attributes

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Available abstract

B-03 STACKING VELOCITY ANALYSIS WITH CRS STACK ATTRIBUTES S. BERGLER P. CHIRA J. MANN K. VIETH and P. HUBRAL Geophysical Institute University of Karlsruhe Hertzstr. 16 76187 Karlsruhe Germany Abstract The Common-Reflection-Surface (CRS) Stack has been established over the past years as an alternative to standard data-driven imaging techniques. The CRS Stack not only yields high-quality stack sections from multi-coverage reflection pre-stack data but also provides—as by-product to the stacked section— important wavefield attributes. With the knowledge of the near-surface velocity only these attributes can be extracted from the stacking parameters which constitute the Common-Reflection-Surface stacking operator. The wavefield attributes

Key concepts: Stacking, Stack (abstract data type), Reflection (computer programming), Surface (topology), Computer science, Geology, Physics, Geometry

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