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2010•Unpublished venueRequires access

Windows Application Using .NET and SAS ® to Produce Custom Rater Reliability Reports

Sailesh Vezzu

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Abstract

Some of the common measures used to monitor rater reliability of constructed response items include Percent Exact Agreement, Percent Adjacent Agreement, Simple Kappa Coefficient, Weighted (Cicchetti-Allison, FleissCohen) Kappa Coefficient, Pearson Correlation Coefficient, Mean Difference, Standardized Mean Difference, and Matched-Pair T-Test. This paper discusses the development of a Windows application using Visual C#.NET and SAS to calculate various measures of rater reliability and produce custom reports. Users can select which measures to include in their reports and set threshold values to flag items with low rater reliability values.

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What this paper is about

Some of the common measures used to monitor rater reliability of constructed response items include Percent Exact Agreement, Percent Adjacent Agreement, Simple Kappa Coefficient, Weighted (Cicchetti-Allison, FleissCohen) Kappa Coefficient, Pearson Correlation Coefficient, Mean Difference, Standardized Mean Difference, and Matched-Pair T-Test. This paper discusses the development of a Windows application using Visual C#.NET and SAS to calculate various measures of rater reliability and produce custom reports. Users can select which measures to include in their reports and set threshold values to flag items with low rater reliability values.

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Available abstract

Some of the common measures used to monitor rater reliability of constructed response items include Percent Exact Agreement, Percent Adjacent Agreement, Simple Kappa Coefficient, Weighted (Cicchetti-Allison, FleissCohen) Kappa Coefficient, Pearson Correlation Coefficient, Mean Difference, Standardized Mean Difference, and Matched-Pair T-Test. This paper discusses the development of a Windows application using Visual C#.NET and SAS to calculate various measures of rater reliability and produce custom reports. Users can select which measures to include in their reports and set threshold values to flag items with low rater reliability values.

Key concepts: Reliability (semiconductor), Kappa, Statistics, Cohen's kappa, Mathematics, Inter-rater reliability, Correlation coefficient, Computer science

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