Direct access test scheme-design of block and core cells for embedded ASICs

Intel requires the use of a direct-access test scheme in embedded-core or block-based ASIC (application-specific integrated-circuit) designs. This scheme provides for separate testing of individual block or core cells using proven test vectors. The authors discuss the design modifications for block cells with low pin counts, user application blocks, and large cores with high pin counts. The implementation and verification of the direct-access test scheme in a block- or core-based embedded ASIC design are also briefly described.>