2003Unpublished venueRequires access

Common-cause failures in repairable systems

B.S. Dhillon, Subramanyam N. Rayapati

Open publisher page 11 citations

Abstract

Eight models are presented for performing reliability analysis of repairable and nonrepairable redundant systems with common-cause failures. The systems studied are redundant configurations such as parallel, k-out-of-n units, and standby. Repairable systems reliability, mean-time-to-failure, and variance of time to failure formulas are developed. In addition, the reliability analysis of a redundant system composed of three state devices with common-cause failures is presented. Specific plots are developed to demonstrate the effect of common-cause failures on redundant system reliability and mean time of failure.>

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What this paper is about

Eight models are presented for performing reliability analysis of repairable and nonrepairable redundant systems with common-cause failures. The systems studied are redundant configurations such as parallel, k-out-of-n units, and standby. Repairable systems reliability, mean-time-to-failure, and variance of time to failure formulas are developed. In addition, the reliability analysis of a redundant system composed of three state devices with common-cause failures is presented. Specific plots are developed to demonstrate the effect of common-cause failures on redundant system reliability and mean time of failure.>

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OpenAlex reports 11 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Eight models are presented for performing reliability analysis of repairable and nonrepairable redundant systems with common-cause failures. The systems studied are redundant configurations such as parallel, k-out-of-n units, and standby. Repairable systems reliability, mean-time-to-failure, and variance of time to failure formulas are developed. In addition, the reliability analysis of a redundant system composed of three state devices with common-cause failures is presented. Specific plots are developed to demonstrate the effect of common-cause failures on redundant system reliability and mean time of failure.>

Key concepts: Reliability engineering, Reliability (semiconductor), Common cause failure, Computer science, Reliability theory, Mean time between failures, Variance (accounting), Redundancy (engineering)

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