2004•Applied Physics LettersRequires access

Evolution of bias field and offset piezoelectric coefficient in bulk lead zirconate titanate with fatigue

Yong Zhang, Ivan S. Baturin, Emil Aulbach, Doru Constantin Lupascu, Andréi L. Kholkin, V. Ya. Shur, Jürgen Rödel

Open publisher page 32 citations

Abstract

Hysteresis loops of the piezoelectric coefficient, d33=f(E3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field Eb, offset piezoelectric coefficient doffset, coercive field Ec, and remnant piezoelectric coefficient dr. The reduction in dr displays the decreasing switchable polarization with fatigue cycling. Eb and doffset are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in Ec and the reduction in dr withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching.

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What this paper is about

Hysteresis loops of the piezoelectric coefficient, d33=f(E3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field Eb, offset piezoelectric coefficient doffset, coercive field Ec, and remnant piezoelectric coefficient dr. The reduction in dr displays the decreasing switchable polarization with fatigue cycling. Eb and doffset are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in Ec and the reduction in dr withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching.

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Available abstract

Hysteresis loops of the piezoelectric coefficient, d33=f(E3), are measured on virgin and fatigued lead zirconate titanate ceramics. Four parameters are directly extracted from the measurements: internal bias field Eb, offset piezoelectric coefficient doffset, coercive field Ec, and remnant piezoelectric coefficient dr. The reduction in dr displays the decreasing switchable polarization with fatigue cycling. Eb and doffset are found to be linearly related. After thermal annealing, both offsets disappear, while the increase in Ec and the reduction in dr withstand annealing. The microscopic entities responsible for the offsets are less stable than those for reduced switching.

Key concepts: Lead zirconate titanate, Piezoelectricity, Materials science, Annealing (glass), Piezoelectric coefficient, Coercivity, Offset (computer science), Composite material

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