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2007•Unpublished venueRequires access

The Exponential Repair Assumption: Practical Impacts

Charles W. Carter, A.W. Malerich

Open publisher page 5 citations

Abstract

For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. Real repair times, as a rule, generally curve fit to the lognormal distribution. We analyzed the system reliability parameters of R(t), Ao, and MTBDE. We found that reliability was sensitive to low values of the ratio MTBF to MRT, and to moderate and low redundancies. In all cases that displayed a statistically significant difference, the exponential repair assumption inflated system reliability

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What this paper is about

For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. Real repair times, as a rule, generally curve fit to the lognormal distribution. We analyzed the system reliability parameters of R(t), Ao, and MTBDE. We found that reliability was sensitive to low values of the ratio MTBF to MRT, and to moderate and low redundancies. In all cases that displayed a statistically significant difference, the exponential repair assumption inflated system reliability

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Available abstract

For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. Real repair times, as a rule, generally curve fit to the lognormal distribution. We analyzed the system reliability parameters of R(t), Ao, and MTBDE. We found that reliability was sensitive to low values of the ratio MTBF to MRT, and to moderate and low redundancies. In all cases that displayed a statistically significant difference, the exponential repair assumption inflated system reliability

Key concepts: Mean time between failures, Log-normal distribution, Exponential distribution, Exponential function, Redundancy (engineering), Reliability engineering, Reliability (semiconductor), Reliability theory

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