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2002•Unpublished venueRequires access

Compact two-pattern test set generation for combinational and full scan circuits

İlker Hamzaoğlu, J.H. Patel

Open publisher page 42 citations

Abstract

This paper presents two algorithms for generating compact test sets for combinational and full scan circuits under the transition and CMOS stuck-open fault models; Redundant Vector Elimination (RVE) and Essential Fault Reduction (EFR). These algorithms together with the dynamic compaction algorithm are incorporated into an advanced ATPG system for combinational circuits, called MinTest. The test sets generated by MinTest are 30% smaller than the previously published two-pattern test set compaction results for the ISCAS85 and full scan version of the ISCAS89 benchmark circuits.

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What this paper is about

This paper presents two algorithms for generating compact test sets for combinational and full scan circuits under the transition and CMOS stuck-open fault models; Redundant Vector Elimination (RVE) and Essential Fault Reduction (EFR). These algorithms together with the dynamic compaction algorithm are incorporated into an advanced ATPG system for combinational circuits, called MinTest. The test sets generated by MinTest are 30% smaller than the previously published two-pattern test set compaction results for the ISCAS85 and full scan version of the ISCAS89 benchmark circuits.

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OpenAlex reports 42 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

This paper presents two algorithms for generating compact test sets for combinational and full scan circuits under the transition and CMOS stuck-open fault models; Redundant Vector Elimination (RVE) and Essential Fault Reduction (EFR). These algorithms together with the dynamic compaction algorithm are incorporated into an advanced ATPG system for combinational circuits, called MinTest. The test sets generated by MinTest are 30% smaller than the previously published two-pattern test set compaction results for the ISCAS85 and full scan version of the ISCAS89 benchmark circuits.

Key concepts: Combinational logic, Automatic test pattern generation, Benchmark (surveying), Test set, Test vector, Test compression, Computer science, Algorithm

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