1.48 and 1.84 μm thulium emissions in monoclinic KGd(WO4)2 single crystals
Frank Güell, Jna. Gavaldà, Rosa Maria Solé, Magdalena Aguiló, Francesc Dı́az, Miguel Á. Galán, J. Massons
Abstract
Open-access reader
Frank Güell, Jna. Gavaldà, Rosa Maria Solé, Magdalena Aguiló, Francesc Dı́az, Miguel Á. Galán, J. Massons
Abstract
Open-access reader
By exciting at 788 nm, we have characterized the near infrared emissions of trivalent thulium ions in monoclinic KGd(WO4)2 single crystals at 1.48 and 1.84 μm as a function of dopant concentration from 0.1% to 10% and temperature from 10 K to room temperature. We used the reciprocity method to calculate the maximum emission cross-section of 3.0×10−20 cm2 at 1.838 μm for the polarization parallel to the Nm principal optical direction. These results agrees well with the experimental data. Experimental decay times of the H43→3F4 and F43→3H6 transitions have been measured as a function of thulium concentration.
OpenAlex reports 40 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
By exciting at 788 nm, we have characterized the near infrared emissions of trivalent thulium ions in monoclinic KGd(WO4)2 single crystals at 1.48 and 1.84 μm as a function of dopant concentration from 0.1% to 10% and temperature from 10 K to room temperature. We used the reciprocity method to calculate the maximum emission cross-section of 3.0×10−20 cm2 at 1.838 μm for the polarization parallel to the Nm principal optical direction. These results agrees well with the experimental data. Experimental decay times of the H43→3F4 and F43→3H6 transitions have been measured as a function of thulium concentration.
Key concepts: Thulium, Monoclinic crystal system, Ion, Materials science, Dopant, Polarization (electrochemistry), Analytical Chemistry (journal), Atomic physics