Reliability assessment of degradation product based on accelerated factor
Haowei Wang, Tingxue Xu
Abstract
Haowei Wang, Tingxue Xu
Abstract
The degradation path based approaches are often used to evaluate reliability of degradation product. Since traditional approaches based on degradation path cannot be used to determine lifetime distribution type, a new approach based on accelerated factor was proposed. The key characteristic of the approach is that all the pseudo lifetimes at each accelerated stress level are converted to the lifetimes at operating stress level by accelerated factor. Thus, the optimal lifetime distribution type can be determined by taking all the converted lifetimes as a whole with Anderson-Darling goodness-of-fit test, and then reliability assessment can be implemented. The proposed approach was illustrated and validated by conducting an accelerated degradation test on a certain type of electrical connector. The reliability of electrical connector was evaluated, and the result showed that the approach based on accelerated factor was valuable.
OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The degradation path based approaches are often used to evaluate reliability of degradation product. Since traditional approaches based on degradation path cannot be used to determine lifetime distribution type, a new approach based on accelerated factor was proposed. The key characteristic of the approach is that all the pseudo lifetimes at each accelerated stress level are converted to the lifetimes at operating stress level by accelerated factor. Thus, the optimal lifetime distribution type can be determined by taking all the converted lifetimes as a whole with Anderson-Darling goodness-of-fit test, and then reliability assessment can be implemented. The proposed approach was illustrated and validated by conducting an accelerated degradation test on a certain type of electrical connector. The reliability of electrical connector was evaluated, and the result showed that the approach based on accelerated factor was valuable.
Key concepts: Reliability (semiconductor), Degradation (telecommunications), Reliability engineering, Computer science, Accelerated aging, Path (computing), Power (physics), Engineering