2002Journal of Applied CrystallographyRequires access

On the intrinsic hook effect associated with pseudo-Voigt profiles

P. Dasgupta

Open publisher page 6 citations

Abstract

An intrinsic hook effect was always found to be associated with pseudo-Voigt (p-V) profiles when η was less than 0.328 and the FWHM was small (∼0.02°), where η is the fraction of the Cauchy component and FWHM is the full width at half-maximum. The applicability of the Warren–Averbach (WA) analysis for the case of p-V profiles was thoroughly studied and it was found that a p-V profile with η values ranging from 0 to 1 can be safely subjected to WA analysis, provided that the FWHM of the profile is large enough (2w≃ 0.378°).

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What this paper is about

An intrinsic hook effect was always found to be associated with pseudo-Voigt (p-V) profiles when η was less than 0.328 and the FWHM was small (∼0.02°), where η is the fraction of the Cauchy component and FWHM is the full width at half-maximum. The applicability of the Warren–Averbach (WA) analysis for the case of p-V profiles was thoroughly studied and it was found that a p-V profile with η values ranging from 0 to 1 can be safely subjected to WA analysis, provided that the FWHM of the profile is large enough (2w≃ 0.378°).

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Available abstract

An intrinsic hook effect was always found to be associated with pseudo-Voigt (p-V) profiles when η was less than 0.328 and the FWHM was small (∼0.02°), where η is the fraction of the Cauchy component and FWHM is the full width at half-maximum. The applicability of the Warren–Averbach (WA) analysis for the case of p-V profiles was thoroughly studied and it was found that a p-V profile with η values ranging from 0 to 1 can be safely subjected to WA analysis, provided that the FWHM of the profile is large enough (2w≃ 0.378°).

Key concepts: Full width at half maximum, Voigt profile, Hook, Line width, Physics, Optics, Spectral line, Engineering

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