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Transition fault simulation for sequential circuits

Kwang-Ting Tim Cheng

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Abstract

This paper addresses the problem of simukating transition faults in synchronous sequential circuits. After presenting the concept of the transition fault modell for sequential circuits, we present a fault simulation algorithm for transition faults. The algorithm is a modification of PROOFS, a parallel, differential fault simulation algorithm for stuck faults. A novel fault injection technique is proposed. Experimental results show that neither a comprehensive functional verification sequence nor a test sequence generated by a sequential circuit test generator for stucck-at faults produces a high fault coverage for transition faults.

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What this paper is about

This paper addresses the problem of simukating transition faults in synchronous sequential circuits. After presenting the concept of the transition fault modell for sequential circuits, we present a fault simulation algorithm for transition faults. The algorithm is a modification of PROOFS, a parallel, differential fault simulation algorithm for stuck faults. A novel fault injection technique is proposed. Experimental results show that neither a comprehensive functional verification sequence nor a test sequence generated by a sequential circuit test generator for stucck-at faults produces a high fault coverage for transition faults.

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OpenAlex reports 31 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

This paper addresses the problem of simukating transition faults in synchronous sequential circuits. After presenting the concept of the transition fault modell for sequential circuits, we present a fault simulation algorithm for transition faults. The algorithm is a modification of PROOFS, a parallel, differential fault simulation algorithm for stuck faults. A novel fault injection technique is proposed. Experimental results show that neither a comprehensive functional verification sequence nor a test sequence generated by a sequential circuit test generator for stucck-at faults produces a high fault coverage for transition faults.

Key concepts: Stuck-at fault, Initialization, Fault (geology), Sequential logic, Computer science, Electronic circuit, Fault coverage, Automatic test pattern generation

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