Transition fault simulation for sequential circuits
Kwang-Ting Tim Cheng
Abstract
Kwang-Ting Tim Cheng
Abstract
This paper addresses the problem of simukating transition faults in synchronous sequential circuits. After presenting the concept of the transition fault modell for sequential circuits, we present a fault simulation algorithm for transition faults. The algorithm is a modification of PROOFS, a parallel, differential fault simulation algorithm for stuck faults. A novel fault injection technique is proposed. Experimental results show that neither a comprehensive functional verification sequence nor a test sequence generated by a sequential circuit test generator for stucck-at faults produces a high fault coverage for transition faults.
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This paper addresses the problem of simukating transition faults in synchronous sequential circuits. After presenting the concept of the transition fault modell for sequential circuits, we present a fault simulation algorithm for transition faults. The algorithm is a modification of PROOFS, a parallel, differential fault simulation algorithm for stuck faults. A novel fault injection technique is proposed. Experimental results show that neither a comprehensive functional verification sequence nor a test sequence generated by a sequential circuit test generator for stucck-at faults produces a high fault coverage for transition faults.
Key concepts: Stuck-at fault, Initialization, Fault (geology), Sequential logic, Computer science, Electronic circuit, Fault coverage, Automatic test pattern generation