R.S. Fetherston, Izaz Shaik, Shaohua Ma
Abstract
This paper describes the testability features and test pattern development methodologies for the AMD-K6/sup TM/ microprocessor. The embedded design for testability (DFT) structures and test strategy provide high quality manufacturing tests.
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This paper describes the testability features and test pattern development methodologies for the AMD-K6/sup TM/ microprocessor. The embedded design for testability (DFT) structures and test strategy provide high quality manufacturing tests.
Key concepts: Testability, Design for testing, Microprocessor, Computer science, Embedded system, Reliability engineering, Computer architecture, Engineering